Cowley: Coherent interference effects in SIEM and CBED, Ultramicroscopy 7, 19–26 (1981) Cowley: Coherent interference in convergent-beam electron diffraction & shadow imaging, Ultramicroscopy 4, 435–450 (1979) Whelan: Electron Microscopy of Thin Crystals, 2nd edn. Cowley (Ed.): Electron Diffraction Techniques (Volume 1), IUCr Monographs on Crystallography, Vol. Bhowmick: Achieving atomic resolution magnetic dichroism by controlling the phase symmetry of an electron probe, Phys. Schattschneider: Production and application of electron vortex beams, Nature 467, 301–304 (2010) Szilagyi: Towards sub-0.5 Å electron beams, Ultramicroscopy 96, 229–237 (2003) Lupini: Towards sub-Å electron beams, Ultramicroscopy 78, 1–11 (1999) Pennycook: Direct sub-angstrom imaging of a crystal lattice, Science 305, 1741 (2004) Krivanek: Sub-ångstrom resolution using aberration corrected electron optics, Nature 418, 617–620 (2002) Urban: Electron microscopy image enhanced, Nature 392, 768–769 (1998) Haider: Correction of spherical and chromatic aberration in a low-voltage SEM, Optik 98, 112–118 (1995) Scherzer: Sphärische und chromatische Korrektur von Elektronen-Linsen, Optik 2, 114–132 (1947) Cowley: Optimum defocus for STEM imaging and microanalysis, Ultramicroscopy 21, 171–178 (1987) Wolf: Principles of Optics (Cambridge Univ. Scherzer: Über einige Fehler von Elektronenlinsen, Z. Nellist: Scanning Transmission Electron Microscopy: Imaging and Analysis (Springer, New York 2011) Cowley: Scanning transmission electron microscopy of thin specimens, Ultramicroscopy 2, 3–16 (1976) Brown: Scanning transmission electron microscopy: Microanalysis for the microelectronic age, J. Crewe: The physics of the high-resolution scanning microscope, Rep. Welter: A high-resolution scanning transmission electron microscope, J. Welter: Electron gun using a field emission source, Rev. scanning transmission electron microscope (STEM)Ī.V.The purpose of this chapter is to describe what the STEM is, to highlight some of the types of experiment that can be performed using a STEM, to explain the principles behind the common modes of operation, to illustrate the features of typical STEM instrumentation, and to discuss some of the limiting factors in its performance. It is the wide variety of possible detectors, and therefore imaging and spectroscopy modes, that gives STEM its strength. The intensity as a function of probe position forms an image. The sample is thinned such that the vast majority of electrons are transmitted, and the scattered electrons detected using some geometry of detector. A beam of electrons is focused by electron optics to form a small illuminating probe that is raster-scanned across a sample. The principle of STEM is quite straightforward. ) has become one of the preeminent instruments for high spatial resolution imaging and spectroscopy of materials, most notably at atomic resolution. The scanning transmission electron microscope (
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